| /* SPDX-License-Identifier: GPL-2.0-or-later */ |
| /* |
| * NAND family Bad Block Management (BBM) header file |
| * - Bad Block Table (BBT) implementation |
| * |
| * Copyright © 2005 Samsung Electronics |
| * Kyungmin Park <kyungmin.park@samsung.com> |
| * |
| * Copyright © 2000-2005 |
| * Thomas Gleixner <tglx@linuxtronix.de> |
| */ |
| #ifndef __LINUX_MTD_BBM_H |
| #define __LINUX_MTD_BBM_H |
| |
| /* The maximum number of NAND chips in an array */ |
| #define NAND_MAX_CHIPS 8 |
| |
| /** |
| * struct nand_bbt_descr - bad block table descriptor |
| * @options: options for this descriptor |
| * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE |
| * when bbt is searched, then we store the found bbts pages here. |
| * Its an array and supports up to 8 chips now |
| * @offs: offset of the pattern in the oob area of the page |
| * @veroffs: offset of the bbt version counter in the oob are of the page |
| * @version: version read from the bbt page during scan |
| * @len: length of the pattern, if 0 no pattern check is performed |
| * @maxblocks: maximum number of blocks to search for a bbt. This number of |
| * blocks is reserved at the end of the device where the tables are |
| * written. |
| * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than |
| * bad) block in the stored bbt |
| * @pattern: pattern to identify bad block table or factory marked good / |
| * bad blocks, can be NULL, if len = 0 |
| * |
| * Descriptor for the bad block table marker and the descriptor for the |
| * pattern which identifies good and bad blocks. The assumption is made |
| * that the pattern and the version count are always located in the oob area |
| * of the first block. |
| */ |
| struct nand_bbt_descr { |
| int options; |
| int pages[NAND_MAX_CHIPS]; |
| int offs; |
| int veroffs; |
| uint8_t version[NAND_MAX_CHIPS]; |
| int len; |
| int maxblocks; |
| int reserved_block_code; |
| uint8_t *pattern; |
| }; |
| |
| /* Options for the bad block table descriptors */ |
| |
| /* The number of bits used per block in the bbt on the device */ |
| #define NAND_BBT_NRBITS_MSK 0x0000000F |
| #define NAND_BBT_1BIT 0x00000001 |
| #define NAND_BBT_2BIT 0x00000002 |
| #define NAND_BBT_4BIT 0x00000004 |
| #define NAND_BBT_8BIT 0x00000008 |
| /* The bad block table is in the last good block of the device */ |
| #define NAND_BBT_LASTBLOCK 0x00000010 |
| /* The bbt is at the given page, else we must scan for the bbt */ |
| #define NAND_BBT_ABSPAGE 0x00000020 |
| /* bbt is stored per chip on multichip devices */ |
| #define NAND_BBT_PERCHIP 0x00000080 |
| /* bbt has a version counter at offset veroffs */ |
| #define NAND_BBT_VERSION 0x00000100 |
| /* Create a bbt if none exists */ |
| #define NAND_BBT_CREATE 0x00000200 |
| /* |
| * Create an empty BBT with no vendor information. Vendor's information may be |
| * unavailable, for example, if the NAND controller has a different data and OOB |
| * layout or if this information is already purged. Must be used in conjunction |
| * with NAND_BBT_CREATE. |
| */ |
| #define NAND_BBT_CREATE_EMPTY 0x00000400 |
| /* Write bbt if neccecary */ |
| #define NAND_BBT_WRITE 0x00002000 |
| /* Read and write back block contents when writing bbt */ |
| #define NAND_BBT_SAVECONTENT 0x00004000 |
| |
| /* |
| * Use a flash based bad block table. By default, OOB identifier is saved in |
| * OOB area. This option is passed to the default bad block table function. |
| */ |
| #define NAND_BBT_USE_FLASH 0x00020000 |
| /* |
| * Do not store flash based bad block table marker in the OOB area; store it |
| * in-band. |
| */ |
| #define NAND_BBT_NO_OOB 0x00040000 |
| /* |
| * Do not write new bad block markers to OOB; useful, e.g., when ECC covers |
| * entire spare area. Must be used with NAND_BBT_USE_FLASH. |
| */ |
| #define NAND_BBT_NO_OOB_BBM 0x00080000 |
| |
| /* |
| * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr |
| * was allocated dynamicaly and must be freed in nand_cleanup(). Has no meaning |
| * in nand_chip.bbt_options. |
| */ |
| #define NAND_BBT_DYNAMICSTRUCT 0x80000000 |
| |
| /* The maximum number of blocks to scan for a bbt */ |
| #define NAND_BBT_SCAN_MAXBLOCKS 4 |
| |
| /* |
| * Bad block scanning errors |
| */ |
| #define ONENAND_BBT_READ_ERROR 1 |
| #define ONENAND_BBT_READ_ECC_ERROR 2 |
| #define ONENAND_BBT_READ_FATAL_ERROR 4 |
| |
| /** |
| * struct bbm_info - [GENERIC] Bad Block Table data structure |
| * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry |
| * @options: options for this descriptor |
| * @bbt: [INTERN] bad block table pointer |
| * @isbad_bbt: function to determine if a block is bad |
| * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for |
| * initial bad block scan |
| * @priv: [OPTIONAL] pointer to private bbm date |
| */ |
| struct bbm_info { |
| int bbt_erase_shift; |
| int options; |
| |
| uint8_t *bbt; |
| |
| int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt); |
| |
| /* TODO Add more NAND specific fileds */ |
| struct nand_bbt_descr *badblock_pattern; |
| |
| void *priv; |
| }; |
| |
| /* OneNAND BBT interface */ |
| extern int onenand_default_bbt(struct mtd_info *mtd); |
| |
| #endif /* __LINUX_MTD_BBM_H */ |