lib/test_scanf: Handle n_bits == 0 in random tests
UBSAN reported (via LKP)
[ 11.021349][ T1] UBSAN: shift-out-of-bounds in lib/test_scanf.c:275:51
[ 11.022782][ T1] shift exponent 32 is too large for 32-bit type 'unsigned int'
When n_bits == 0, the shift is out of range. Switch code to use GENMASK
to handle this case.
Fixes: 50f530e176ea ("lib: test_scanf: Add tests for sscanf number conversion")
Reported-by: kernel test robot <oliver.sang@intel.com>
Signed-off-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com>
Reviewed-by: Richard Fitzgerald <rf@opensource.cirrus.com>
Signed-off-by: Petr Mladek <pmladek@suse.com>
Link: https://lore.kernel.org/r/20210727150132.28920-1-andriy.shevchenko@linux.intel.com
diff --git a/lib/test_scanf.c b/lib/test_scanf.c
index 48ff574..6a828df 100644
--- a/lib/test_scanf.c
+++ b/lib/test_scanf.c
@@ -271,7 +271,7 @@ static u32 __init next_test_random(u32 max_bits)
{
u32 n_bits = hweight32(prandom_u32_state(&rnd_state)) % (max_bits + 1);
- return prandom_u32_state(&rnd_state) & (UINT_MAX >> (32 - n_bits));
+ return prandom_u32_state(&rnd_state) & GENMASK(n_bits, 0);
}
static unsigned long long __init next_test_random_ull(void)
@@ -280,7 +280,7 @@ static unsigned long long __init next_test_random_ull(void)
u32 n_bits = (hweight32(rand1) * 3) % 64;
u64 val = (u64)prandom_u32_state(&rnd_state) * rand1;
- return val & (ULLONG_MAX >> (64 - n_bits));
+ return val & GENMASK_ULL(n_bits, 0);
}
#define random_for_type(T) \