| commit | 6210500691b21e1f755b0076dd54fdb31236e2de | [log] [tgz] |
|---|---|---|
| author | Akinobu Mita <akinobu.mita@gmail.com> | Mon Nov 12 11:00:50 2018 -0500 |
| committer | Mauro Carvalho Chehab <mchehab+samsung@kernel.org> | Fri Nov 23 04:45:49 2018 -0500 |
| tree | 318db053b293a47d2896f13524c849afb2f0bfe3 | |
| parent | dde64f725a4d0afa7a589292365afe5759af7388 [diff] |
media: ov2640: add V4L2_CID_TEST_PATTERN control The ov2640 has the test pattern generator features. This makes use of it through V4L2_CID_TEST_PATTERN control. [Sakari Ailus: Use "Eight Vertical Colour Bars" as the second manu entry] Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com> Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>