| commit | 53f6f81da7db96557fe2bff9b15bd6b83d301f9f | [log] [tgz] |
|---|---|---|
| author | Chen, JasonX Z <jasonx.z.chen@intel.com> | Wed Nov 07 21:47:34 2018 -0500 |
| committer | Mauro Carvalho Chehab <mchehab+samsung@kernel.org> | Fri Nov 23 04:43:59 2018 -0500 |
| tree | 5b9cdaae4b6e050a371008b224452161aa977485 | |
| parent | 9ffd7ffe6504379d40b07b03510f3ef080f85af9 [diff] |
media: imx258: remove test pattern map from driver change bayer order when using test pattern mode. remove test pattern mapping method [Sakari Ailus: Drop extra added newline] Signed-off-by: Chen, JasonX Z <jasonx.z.chen@intel.com> Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com> Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>